Our development is limited to steady-state operations . 我們的推導(dǎo)限于穩(wěn)定狀態(tài)操作。
These stabilizing design changes are usually not desirable for steady-state operation . 這些增加穩(wěn)定性的設(shè)計(jì)改變通常不太符合穩(wěn)態(tài)工作的要求。
The value of dynamic stability lies in the definition of the kind of steady-state operation that the system can sustain . 動(dòng)態(tài)穩(wěn)定性的優(yōu)劣取決于系統(tǒng)維持穩(wěn)態(tài)工作的范圍。
Analyzing result of simulated experiment data shows that the test method can increase availably the accuracy of the transistor steady - state operation life test method 模擬試驗(yàn)數(shù)據(jù)分析結(jié)果表明,該試驗(yàn)方法可以有效地提高晶體管穩(wěn)態(tài)工作壽命試驗(yàn)方法的可信度。
To increase the accuracy of the test method , a steady - state operation life test method with additional measuring and strictly controlling transistor junction temperature , in the highest temperature range , is given 旨在提高晶體管穩(wěn)態(tài)工作壽命試驗(yàn)方法的可信度,提出了一種在試驗(yàn)過程中實(shí)時(shí)測量并嚴(yán)格控制晶體管結(jié)溫在最高允許結(jié)溫附近的穩(wěn)態(tài)工作壽命試驗(yàn)方法。